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Rudolph Research / AutoEL III Ellipsometer III2A4C 1984

$ 792

Availability: 100 in stock
  • Brand: Rudolph Research
  • Equipment Type: Ellipsometer
  • All returns accepted: ReturnsNotAccepted
  • MPN: III2A4C
  • Condition: Used

    Description

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    Rudolph Research / AutoEL III Ellipsometer III2A4C 1984
    The Rudolph Ellipsometer AutoELIII allows measurement of the thickness and refractive index of one or two thin transparent films on a substrate.
    Features:
    Internal data reduction software for single and double layer transparent films.
    SECS II Interface
    Built in printer.
    Specifications:
    Maximum wafersize: 150 mm
    633 nm wavelength
    6in dia. quickload stage
    Measuring time 17 to 50 seconds
    Sample stage: movement X/Y
    Condition and Testing
    Device has been tested and is in working condition as of Feb 2013.
    Device last powered on as of March 2021.
    Device has been in climate controlled storage since Feb 2013, until March 2021 at 16C <30% humidity.
    Device was used in a Research and Development Laboritory.
    The unit has been used but still appears to be in good condition with minor scratches and scuff marks from normal wear and tear.
    Contact us
    We can be contacted at any time through eBay messages if you have any questions, comments or product requests. We will respond to you within 72 hours and do our best to help you out! We encourage our customers to contact us
    with any questions or concerns! We'd like to be sure you are completely satisfied with your purchase.
    Offers are welcome!
    Returns Not Accepted